This Scanning Electron Microscope (SEM) systems give direct access to the high-resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures. This unit is the ultimate all-in-one imaging and EDS analysis system.
The advanced system identifies different elements in a specimen by using the fully integrated Element Identification software and specially designed EDS detector. The optional Elemental Mapping software provides information on the distribution of elements within the sample or the selected line. The results of the analysis can easily be exported and reported.