Scanning Electron Microscope (SEM)

GUARANTEE

Having warranty from our factory in main unit and free for upgrade software. In measurement accuracy and repeatability are guaranteed at all measure, so you can be confident with your measurement results.

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EXPERIENCE

With our experience in testing equipment, we strive to continuously improve the quality of our services in all customers both in terms of sales, product quality, technical service and after sales service.

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SYSTEM FRIENDLY

Simplified and guided operation of the all our testing equipment settings makes it easier for users to make adjustments and reproduce system settings in main unit and software.

This Scanning Electron Microscope (SEM) systems give direct access to the high-resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures. This unit is the ultimate all-in-one imaging and EDS analysis system.
The advanced system identifies different elements in a specimen by using the fully integrated Element Identification software and specially designed EDS detector. The optional Elemental Mapping software provides information on the distribution of elements within the sample or the selected line. The results of the analysis can easily be exported and reported.
 
Any question? please contact us.